Publications

Peer reviewed papers

High-T_c SQUID magnetometers for biomagnetic measurements,
B. David, D. Grundler, S. Krey, V. Doormann, R. Eckart, J.P. Krumme, G.Rabe, and O. Dössel, Supercond. Sci. Technol. 9, A96-A99 (1996) [PDF].

Low noise YBa₂Cu₃O_7-x SQUID magnetometers operated with additional positive feedback,
D. Drung, E. Dantsker, F. Ludwig, H. Koch, R. Kleiner, J. Clarke, S. Krey, D. Reimer, B. David and O. Dössel, Appl. Phys. Lett. 68, 1856 (1996) [PDF].

Biomagnetic measurements with an integrated YBa₂Cu₃O₇ magnetometer in a hand-held cryostat,
M. Schilling, S. Krey, and R. Scharnweber, Appl. Phys. Lett. 69, 2749 (1996) [PDF].

Integrated YBa₂Cu₃O₇ Magnetometers for Biomagnetic Applications,
S. Krey, K.-O. Subke, D. Reimer, M. Schilling, R. Scharnweber, and B. David, Applied Superconductivity Vol. 5, Nos 7-12, pp. 213-219 (1998) [PDF].

Low noise operation of integrated YBa₂Cu₃O₇ magnetometers in static magnetic fields,
S. Krey, B. David, R. Eckart, and O. Dössel, Appl. Phys. Lett. 72, 3205 (1998) [PDF].

Technology for YBa₂Cu₃O₇ SNS- and SIS-Josephson Junctions,
K.-O. Subke, S. Krey, H. Burkhardt, A. Bartold, and M. Schilling, IEEE Trans. Appl. Supercond. 9, 3125 (1999) [PDF].

Noise Properties of YBa₂Cu₃O₇ Josephson Junction Array Magnetometers,
S. Krey, O. Brügmann, H. Burkhardt, and M. Schilling, IEEE Trans. Appl. Supercond. 9, 3401 (1999) [PDF].

Highly sensitive magnetometers based on YBa₂Cu₃O₇ Josephson junction arrays,
S. Krey, O. Brügmann, and M. Schilling, Appl. Phys. Lett. 74, 293 (1999) [PDF].

Low-frequency noise and linearity of YBa₂Cu₃O₇ dc superconducting quantum interference device magnetometers in static magnetic fields,
S. Krey, H.-J. Barthelmess, and M. Schilling, J. Appl. Phys. 86, 6602 (1999) [PDF].

Sensitive Josephson magnetometry of flux quantization in a normal conducting hole in a narrow YBa₂Cu₃O₇ line,
H.-J. Barthelmess, S. Krey, S. Ostertun, and M. Schilling, Appl. Phys. Lett. 77, 1882 (2000) [PDF].

Conference proceedings

1995

High-T _cSQUID Magnetometers for Magnetocardiography,
O. Dössel, B. David, R. Eckart, D. Grundler, S. Krey, Proceedings of 2^nd Workshop on HTS Applications and New Materials, University of Twente, Enschede, The Netherlands, May 8-10, 1995, Ed. Dave H.A. Blank [PDF].

Ein Mehrschleifen-SQUID Magnetometer basierend auf YBaCuO-Stufenkontakten,
S. Krey, B. David, V. Doormann, R. Eckart, J.P. Krumme, G. Rabe und O. Dössel, Konferenz Kryoelektronische Bauelemente ’95 (Kryo ’95), Weilrod-Mauloff, 8.-10. Oktober 1995 [Abstract].

1996

SQUID Magnetometers made from NdBa₂Cu₃0₇ and YBa₂Cu₃0₇ thin-films
B. David, S. Krey, R. Eckart, V. Doormann, G. Rabe, J. P. Krumme, and O. Dössel, Proceedings of the 1996 Applied Superconductivity Conference (ASC´96), August 25-30, 1996, Pittsburgh, Pennsylvania [Poster].

Optimierung von Mehrschleifen-SQUID-Magnetometern für den Betrieb in unabgeschirmter Umgebung,
S. Krey, B. David, V. Doormann, R. Eckart, J.P. Krumme, G. Rabe und O. Dössel, Konferenz Kryoelektronische Bauelemente ’96 (Kryo ’96), Jena, 6.-8. Oktober 1996 [Abstract].

Biomagnetische Anwendungen mit integrierten Hoch-T_c Magnetometern bei 77 K,
M. Schilling, S. Krey, D. Reimer, R. Scharnweber, K.-O. Subke und U. Merkt, Konferenz Kryoelektronische Bauelemente ’96 (Kryo ’96), Jena, 6.-8. Oktober 1996 [Abstract].

1997

Process Optimization for High Yield of YBa₂Cu₃O₇ Ramp-Edge Josephson Junctions with PrBa ₂Cu₃O₇ Barriers,
K.-O. Subke, S. Krey, H. Burkhardt, D. Reimer, and M. Schilling, Proceedings of the 6^th International Superconductive Electronics Conference (ISEC´97), June 25-28, 1997, Berlin, Germany, Eds. H. Koch and S. Knappe [Extended Abstract].

Integrated YBa₂Cu₃O₇ Magnetometers for Biomagnetic Applications,
S. Krey, K.-O. Subke, D. Reimer, M. Schilling, and R. Scharnweber, Proceedings of the 6^th International Superconductive Electronics Conference (ISEC´97), June 25-28, 1997, Berlin, Germany, Eds. H. Koch and S. Knappe [Extended Abstract].

Optimierung von Josephson-Kontakten in Rampengeometrie auf hohe Reproduzierbarkeit für den Einsatz in rauscharmen integrierten Magnetometern,
K.-O. Subke, S. Krey, H. Burkhardt, M. Schilling, Konferenz Kryoelektronische Bauelemente ’97 (Kryo ’97), Bad Herrenalb, 21.-23. September 1997 [Abstract].

1998

Noise Properties of YBa₂Cu₃O₇ Josephson Junction Array Magnetometers,
S. Krey, O. Brügmann, H. Burkhardt, and M. Schilling, Proceedings of the 1998 Applied Superconductivity Conference (ASC´98), September 13-18, 1998, Palm Desert, California, [Extended Abstract].

1999

Low-frequency noise and linearity of YBa₂Cu₃O₇ dc SQUID magnetometers in static magnetic fields,
S. Krey, H.-J. Barthelmess, and M. Schilling, Proceedings of the 7^th International Superconductive Electronics Conference (ISEC´99), June 21-25, 1999, Berkeley, CA, [Extended Abstract], [Poster].

Operation of integrated HTS dc-SQUID magnetometers in unshielded environment,
K.-O. Subke, C. Hinnrichs, S. Krey, H.-J. Barthelmess, C. Pels and M. Schilling, Proc. EUCAS ’99, 4^th European Conference on Applied Superconductivity, Sept. 14-17, 1999, Sitges, Spain, [PDF].

2002

Novel scheme for the ultraprecise and fast measurement of the nanotopography of large wafers,
I. Weingärtner, M. Wurm, R.D. Geckeler, C. Elster, M. Schulz, E. Dumitrescu, S. Krey, J. Heinisch, Proc. SPIE Vol. 4779, p. 13-22, Nov. 2002, Advanced Characterization Techniques for Optical, Semiconductor, and Data Storage Components; Angela Duparré, Bhanwar Singh; Eds., DOI:10.1117/12.451713 [PDF].

2003

Ultra-Fast MTF Test for High-Volume Production of CMOS Imaging Cameras,
M. Dahl, J. Heinisch, S. Krey, S. Bäumer, J. Lurquin, Linghua Chen, Proceedings of the SPIE International Symposium on Optical Science and Technology, Aug. 3-8, 2003, San Diego, DOI:10.1117/12.507928 [PDF].

Wafer Topography Measurement by Fast Optical Scanning Deflectometry,
S. Krey, F. Peter, E. Dumitrescu, W.D. van Amstel, R.G. Klaver, E.J. Lous, Proceedings of the CLEO/EUROPE 2003 Conference on Lasers and Electro-Optics/Europe, June 22-27, 2003, Munich, DOI:10.1109/CLEOE.2003.1313528 [Abstract].

Accurate Topography Measurement of Large Flat Surfaces,
F. Peter, S. Krey, E. Dumitrescu, I. Weingärtner, M. Wurm, H. Winkler, Proceedings of the CLEO/EUROPE 2003 Conference on Lasers and Electro-Optics/Europe, June 22-27, 2003, Munich, DOI:10.1109/CLEOE.2003.1313530 [Abstract].

2004

A fast optical scanning deflectometer for measuring the topography of large silicon wafers,
S. Krey, W. D. van Amstel, K. Szwedowicz, J. Campos, A. Moreno, E. J. Lous, Proc. SPIE Vol. 5523, p. 110-120, Oct. 2004, Current Developments in Lens Design and Optical Engineering V; Pantazis Z. Mouroulis, Warren J. Smith, R. Barry Johnson; Eds., DOI:10.1117/12.559702 [PDF].

2005

Measurement of Aspheric Surfaces with 3D-Deflectometry,
I. Scheele, S. Krey, Proceedings of the 106^th Conference of the DGaO, May 17-21, 2005, Wrocław, [Extended Abstract].

2006

Integrated Optical Characterization of Intraocular Lenses,
S. Krey, J. Heinisch, Laser Optics Berlin (LOB), March 23-24, 2006, Berlin, [Abstract], [Poster].

Novel technique for measurement of centration errors of complex completely mounted multi-element objective lenses,
J. Heinisch, E. Dumitrescu, and S. Krey Proc. SPIE 6288, 628810 (2006), Aug. 14, 2006, San Diego, Current Developments in Lens Design and Optical Engineering VII, Pantazis Z. Mouroulis; Warren J. Smith; R. Barry Johnson, Eds., DOI:10.1117/12.693356 [PDF].

2007

Automatic Centring and Bonding of Lenses,
S. Krey, J. Heinisch, E. Dumitrescu, Proceedings of SPIE Optifab 2007, May 14-17, 2007, Rochester. [Extended Abstract].

Aspheric lens tester with Shack-Hartmann sensor,
A. K. Ruprecht, I. Scheele, S. Krey, J. Heinisch, Proceedings of SPIE Optifab 2007, May 14-17, 2007, Rochester. [Extended Abstract].

Measurement of aspheric surfaces with 3D-Deflectometry,
I. Scheele, S. Krey, J. Heinisch, Proceedings of SPIE Optifab 2007, May 14-17, 2007, Rochester. [Extended Abstract].

Highest Precision Centering Error Measurement,
J. Heinisch, E. Dumitrescu, S. Krey, Proceedings of SPIE Optifab 2007, May 14-17, 2007, Rochester. [Extended Abstract].

Realtime MTF measurement of CMOS and CCD cameras,
J. Heinisch, E. Dumitrescu, S. Krey, Proceedings of SPIE Optifab 2007, May 14-17, 2007, Rochester. [Extended Abstract].

2008

High quantity wavefront measurement of miniature aspheric optics on wafer level,
I. Erichsen, M. Cherrier, A. Ruprecht, S. Krey, Proceedings of the Conference on Lasers and Electro Optics (CLEO) 2008, May 4-9, 2008, San Jose, [Extended Abstract].

Ultra-fast wavefront analyser for high volume production of camera modules lenses,
M. Cherrier, I. Erichsen, A. Ruprecht, and S. Krey, Proc. SPIE 6995, 699512 (2008), Apr. 8, 2008, Strasbourg, Optical Micro- and Nanometrology in Microsystems Technology II, Christophe Gorecki, Anand K. Asundi, Wolfgang Osten, Eds., DOI:10.1117/12.781433 [PDF].

High resolution wavefront measurement of aspheric optics,
I. Erichsen, S. Krey, J. Heinisch, A. Ruprecht, and E. Dumitrescu, Proc. SPIE 7060, 70600T (2008), Aug. 11, 2008, San Diego, Current Developments in Lens Design and Optical Engineering IX, Pantazis Z. Mouroulis, Warren J. Smith, R. Barry Johnson, Eds., DOI:10.1117/12.794467 [PDF].

2009

Quality Assurance of Modern Optics in Production,
S. Krey, Kolloquium »Optik – Schlüsseltechnologie mit Zukunft«, Fraunhofer-Institut für Produktionstechnologie (IPT), 18.-19. März 2009, Aachen. [Extended Abstract], [Presentation].

2010

Characterization of intraocular lenses: a comparison of different measurement methods,
M. Cherrier, I. Erichsen, S. Krey, Proc. SPIE. 7556, Design and Quality for Biomedical Technologies III, 75560W, February 11, 2010, DOI: 10.1117/12.843665

A deflectometric sensor for the on-machine surface form measurement and adaptive manufacturing,
S. Krey, I. Erichsen, I. Mahns, W. D. van Amstel, K. Vielhaber, Proc. SPIE 7718, Optical Micro- and Nanometrology III, 77180C, April 30, 2010, DOI: 10.1117/12.854643

Simple methods for alignment of line distance sensor arrays,
H. Bremer, F. Schmähling, C. Elster, S. Krey, A. Ruprecht, M. Schulz, M. Stavridis, A. Wiegmann, Proc. SPIE. 7718, Optical Micro- and Nanometrology III, 77181M, April 30, 2010, DOI: 10.1117/12.854266

2011

Automated measurement of centering errors and relative surface distances for the optimized assembly of micro-optics,
P. Langehanenberg, E. Dumitrescu, J. Heinisch, S. Krey, A. K. Ruprecht, Proc. SPIE 7926, Micromachining and Microfabrication Process Technology XVI, 79260E, February 14, 2011, DOI:10.1117/12.874628

2012

Surface topography and optical performance measurement of microlenses used in high power VCSEL systems,
I. Erichsen, S. Krey, Proc. SPIE. 8276, Vertical-Cavity Surface-Emitting Lasers XVI, 82760C, February 9, 2012, DOI: 10.1117/12.908130

2014

Measuring the refractive index with precision goniometers: a comparative study,
S. Krey, D. Off, A. Ruprecht, Proc. SPIE. 8992, Photonic Instrumentation Engineering, 89920D, March 8, 2014, DOI: 10.1117/12.2041760

Automated assembly of camera modules using active alignment with up to six degrees of freedom,
K. Bräuniger, D. Stickler, D. Winters, C. Volmer, M. Jahn, S. Krey, Proc. SPIE. 8992, Photonic Instrumentation Engineering, 89920F, March 8, 2014, DOI: 10.1117/12.2041754

Stefan Krey

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